• DocumentCode
    1819887
  • Title

    The effect of residual electrode resistance and sampling delay on transient instability in the dynamic clamp system

  • Author

    Preyer, A.J. ; Butera, R.J.

  • Author_Institution
    Georgia Tech/Emory Univ., Atlanta
  • fYear
    2007
  • fDate
    22-26 Aug. 2007
  • Firstpage
    430
  • Lastpage
    433
  • Abstract
    The dynamic clamp technique uses feedback to combine computational modeling with electrophysiology experiments. It is commonly used to simulate computational ionic currents in real-time and inject the resulting current into the neuron, as if it were part of the cell. Increasing the magnitude of the simulated conductances leads to transient instabilities. In this paper we use physical experiments, computational simulation, and stability analysis to examine the effects uncompensated electrode resistance and sampling delay have on this transient instability. We find that uncompensated electrode resistance decreases the maximum usable conductance that maintains a stable system. Also, we find that commonly used sampling rates limit the maximum conductance that maintains a stable system, and that these limitations are not due to the kinetics of the underlying ion channel model.
  • Keywords
    bioelectric phenomena; biological techniques; biomembrane transport; neural nets; neurophysiology; physiological models; computational ionic currents; computational modeling; dynamic clamp system; intracellular electrophysiology; ion channel model; neuronal networks; residual electrode resistance; sampling delay; transient instability; Analytical models; Clamps; Computational modeling; Delay effects; Electrodes; Neurofeedback; Neurons; Physics computing; Sampling methods; Stability analysis; Animals; Aplysia; Electric Impedance; Electrodes; Electrophysiology; Ganglia; Humans; Ion Channels; Ion Transport; Kinetics; Models, Biological; Neurons; Patch-Clamp Techniques;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2007. EMBS 2007. 29th Annual International Conference of the IEEE
  • Conference_Location
    Lyon
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-0787-3
  • Type

    conf

  • DOI
    10.1109/IEMBS.2007.4352315
  • Filename
    4352315