DocumentCode :
1819887
Title :
The effect of residual electrode resistance and sampling delay on transient instability in the dynamic clamp system
Author :
Preyer, A.J. ; Butera, R.J.
Author_Institution :
Georgia Tech/Emory Univ., Atlanta
fYear :
2007
fDate :
22-26 Aug. 2007
Firstpage :
430
Lastpage :
433
Abstract :
The dynamic clamp technique uses feedback to combine computational modeling with electrophysiology experiments. It is commonly used to simulate computational ionic currents in real-time and inject the resulting current into the neuron, as if it were part of the cell. Increasing the magnitude of the simulated conductances leads to transient instabilities. In this paper we use physical experiments, computational simulation, and stability analysis to examine the effects uncompensated electrode resistance and sampling delay have on this transient instability. We find that uncompensated electrode resistance decreases the maximum usable conductance that maintains a stable system. Also, we find that commonly used sampling rates limit the maximum conductance that maintains a stable system, and that these limitations are not due to the kinetics of the underlying ion channel model.
Keywords :
bioelectric phenomena; biological techniques; biomembrane transport; neural nets; neurophysiology; physiological models; computational ionic currents; computational modeling; dynamic clamp system; intracellular electrophysiology; ion channel model; neuronal networks; residual electrode resistance; sampling delay; transient instability; Analytical models; Clamps; Computational modeling; Delay effects; Electrodes; Neurofeedback; Neurons; Physics computing; Sampling methods; Stability analysis; Animals; Aplysia; Electric Impedance; Electrodes; Electrophysiology; Ganglia; Humans; Ion Channels; Ion Transport; Kinetics; Models, Biological; Neurons; Patch-Clamp Techniques;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2007. EMBS 2007. 29th Annual International Conference of the IEEE
Conference_Location :
Lyon
ISSN :
1557-170X
Print_ISBN :
978-1-4244-0787-3
Type :
conf
DOI :
10.1109/IEMBS.2007.4352315
Filename :
4352315
Link To Document :
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