• DocumentCode
    1819921
  • Title

    Correlation between IDDQ testing quality and sensor accuracy

  • Author

    Dalpasso, Marcello ; Favalli, Michele ; Olivo, Piero

  • Author_Institution
    Dipartimento di Elettronica, Inf. e Sistemistica, Bologna Univ., Italy
  • fYear
    1995
  • fDate
    6-9 Mar 1995
  • Firstpage
    568
  • Lastpage
    572
  • Abstract
    In existing approaches to IDDQ fault simulation, the lack of estimate of the faulty current values in comparison with the instrumentation sensitivity prevents realistic assessments of testing quality. This paper fills the gap, presenting a method to estimate the faulty current considering the device conductances as well as the bridging resistance, and computing the fault coverage as a function of the sensor accuracy. Such information helps in the design of current monitoring equipments
  • Keywords
    CMOS integrated circuits; circuit analysis computing; fault diagnosis; fault location; integrated circuit testing; CMOS; IDDQ testing quality; bridging resistance; current monitoring equipment; device conductances; fault coverage; fault simulation; faulty current values; sensor accuracy; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Current measurement; Electrical fault detection; Fault detection; Instruments; Integrated circuit testing; Monitoring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    European Design and Test Conference, 1995. ED&TC 1995, Proceedings.
  • Conference_Location
    Paris
  • Print_ISBN
    0-8186-7039-8
  • Type

    conf

  • DOI
    10.1109/EDTC.1995.470343
  • Filename
    470343
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1819921