DocumentCode
1820091
Title
A 0.5-18 GHz Semi-Automatic Noise Parameter Measurement Technique
Volume
1
fYear
1982
fDate
30103
Firstpage
42
Lastpage
58
Keywords
Acoustic reflection; Admittance measurement; Equations; Measurement techniques; Noise figure; Noise measurement; Noise reduction; Parameter estimation; Scattering parameters; Semiconductor device measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Spring, 19th ARFTG
Conference_Location
Dallas, TX, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.1982.323482
Filename
4118870
Link To Document