Performance comparison of VLV, ULV, and ECR tests [biomedical IC product]

Author

Jiang, Wanli ; Peterson, Eric

Author_Institution

Test Eng., Guidant Corp., St. Paul, MN, USA

fYear

2002

fDate

2002

Firstpage

31

Lastpage

36

Abstract

Very-Low-Voltage, Ultra-Low-Voltage (a modified version of Minimum-Voltage), and Energy Consumption Ratio (a recently developed test metric) tests are applied as supplemental tests along with existing traditional tests to a biomedical IC product. The effectiveness and efficiency of these supplemental tests are evaluated and compared with some major traditional tests. The effectiveness analysis indicates that Ultra-Low-Voltage and Energy Consumption Ratio tests identified potentially defective devices from good devices. The efficiency analysis shows that the Energy Consumption Ratio test is much more efficient than Very-Low-Voltage, Ultra-Low-Voltage and major traditional tests.

Keywords

biomedical electronics; fault diagnosis; integrated circuit testing; low-power electronics; production testing; prosthetics; biomedical IC product; defective device identification; efficiency analysis; energy consumption ratio tests; high quality IC products; implantable biomedical devices; supplemental tests; ultra-low-voltage tests; very-low-voltage tests; Biomedical engineering; Circuit faults; Circuit testing; Current measurement; Energy consumption; Integrated circuit testing; Logic testing; Manufacturing; Power engineering and energy; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE

Print_ISBN

0-7695-1570-3

Type

conf

DOI

10.1109/VTS.2002.1011107

Filename

1011107