DocumentCode :
1820435
Title :
Innovations in test automation
Author :
Sproch, Jim ; Howells, Michael ; Rajski, Janusz
Author_Institution :
Synopsys Inc.
fYear :
2002
fDate :
2002
Firstpage :
43
Lastpage :
43
Keywords :
Automatic testing; Design automation; Electronic equipment testing; Electronics industry; Graphics; Manufacturing automation; National electric code; Semiconductor device testing; System testing; Technological innovation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
Print_ISBN :
0-7695-1570-3
Type :
conf
DOI :
10.1109/VTS.2002.1011109
Filename :
1011109
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1820435
بازگشت