Title :
On software development to support statistical simulation of analogue circuits
Author :
Driouk, Evgueni ; Jarov, Oleg ; Sukhodolsky, Alexander
Author_Institution :
Dept. of Microelectron., Byelorussian State Univ. of Inf. & Radioelectron., Minsk, Byelorussia
Abstract :
A system for statistical circuit analysis, yield estimation and design centering is presented. The system architecture is based on the decomposition of the simulation process into three logically independent layers. A dedicated language is a significant part of the system. Its syntax implements an advanced technique that allows one to create flexible circuit performance extraction procedures. An application example demonstrates the system capabilities
Keywords :
analogue integrated circuits; circuit analysis computing; integrated circuit yield; software engineering; statistical analysis; analogue circuits; circuit performance extraction procedures; dedicated language; design centering; software development; statistical circuit analysis; statistical simulation; yield estimation; Analytical models; Circuit optimization; Circuit simulation; Circuit synthesis; Data mining; Manufacturing; Production; Programming; Statistical analysis; Yield estimation;
Conference_Titel :
European Design and Test Conference, 1995. ED&TC 1995, Proceedings.
Conference_Location :
Paris
Print_ISBN :
0-8186-7039-8
DOI :
10.1109/EDTC.1995.470348
