DocumentCode :
1820596
Title :
Measurement Environment Simulation of a Microwave Automatic Network Analyzer
Author :
Sotoudeh, Vahid ; Roos, Mark
Author_Institution :
EIP Microwave Inc.
Volume :
10
fYear :
1986
fDate :
Dec. 1986
Firstpage :
47
Lastpage :
55
Keywords :
Analytical models; Calibration; Computational modeling; Equations; Error correction; Frequency response; Microwave devices; Microwave measurements; Noise figure; Scattering parameters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest-Winter, 28th ARFTG
Conference_Location :
Saint Petersburg Beach, Fl, USA
Print_ISBN :
0-7803-5686-1
Type :
conf
DOI :
10.1109/ARFTG.1986.323503
Filename :
4118893
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1820596
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