DocumentCode
1820636
Title
A successful DFT tester: what will it look like? is revolution in test approaches required?
Author
Song, Lee ; Garcia, Rudy ; Levy, Andrew ; Wheater, Don
Author_Institution
Teradyne
fYear
2002
fDate
April 28 2002-May 2 2002
Firstpage
87
Lastpage
87
Keywords
Built-in self-test; Costs; Design for testability; Design methodology; Electronics industry; Fires; Production; Semiconductor device testing; Signal design; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
Conference_Location
Monterey, CA, USA
Print_ISBN
0-7695-1570-3
Type
conf
DOI
10.1109/VTS.2002.1011116
Filename
1011116
Link To Document