DocumentCode :
1820691
Title :
How effective are compression codes for reducing test data volume?
Author :
Chandra, Anshuman ; Chakrabarty, Krishnendu ; Medina, Rafael A.
Author_Institution :
Dept. Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
fYear :
2002
fDate :
2002
Firstpage :
91
Lastpage :
96
Abstract :
Run-length codes and their variants have recently been shown to be very effective for compressing system-on-a-chip (SOC) test data. In this paper, we analyze the Golomb code, the conventional run-length code and the FDR code for a binary memoryless data source, and compare the compression obtained in each case to fundamental entropy bounds. We show analytically that the FDR code outperforms both the conventional run-length code and the Golomb code for test resource partitioning (TRP) based on data compression. We also present a modified compression/decompression architecture for obtaining even higher compression. We demonstrate the effectiveness of these compression codes using the larger ISCAS-89 benchmark circuits and two representative circuits from industry. Finally, we show that the FDR code is almost as effective as Unix utilities gzip and compress, even though it uses a much simpler decompression algorithm.
Keywords :
automatic testing; data compression; integrated circuit testing; runlength codes; FDR code; Golomb code; binary memoryless data source; compression codes; data compression; fundamental entropy bounds; modified compression/decompression architecture; run-length codes; test data compression; test data volume reduction; test resource partitioning; Automatic testing; Circuit testing; Computer science; Decoding; Entropy; Hip; Performance analysis; System testing; System-on-a-chip; Test data compression;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
Print_ISBN :
0-7695-1570-3
Type :
conf
DOI :
10.1109/VTS.2002.1011117
Filename :
1011117
Link To Document :
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