Title :
A high resolution multihit time to digital converter integrated circuit
Author :
Gorbics, M.S. ; Kelly, J. ; Roberts, K.M. ; Sumner, R.L.
Author_Institution :
LeCroy Corp., Chestnut Ridge, NY, USA
Abstract :
We describe a pipelined, multihit time to digital converter, capable of operating in common stop mode, with double hit resolution of approximately 10 nanoseconds, maximum time range of 10 microseconds and least count of 50 picoseconds. This is constructed with a standard CMOS process using a novel application of the Vernier principle. This device has many potential applications in high energy and nuclear physics experiments, as well as other fields of research. We present results from measurements of a test chip
Keywords :
CMOS integrated circuits; analogue-digital conversion; detector circuits; nuclear electronics; Vernier principle; common stop mode; double hit resolution; high resolution multihit time to digital converter integrated circuit; pipelined multihit time to digital converter; standard CMOS process; CMOS process; Clocks; Counting circuits; Delay effects; Delay lines; Energy resolution; Integrated circuit measurements; Length measurement; Nuclear physics; Semiconductor device measurement;
Conference_Titel :
Nuclear Science Symposium, 1996. Conference Record., 1996 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-3534-1
DOI :
10.1109/NSSMIC.1996.591017
