Accumulator-based BIST approach for stuck-open and delay fault testing

In this paper a novel accumulator-based Built-In Self Test (BIST) method for complete two-pattern test generation is presented. Complete two-pattern testing has been proposed for stuck-open and delay testing. The proposed scheme is very attractive for a wide range of circuits based on data-path architectures with arithmetic units, or with accumulators containing binary adders. Our method generates all 2ⁿ (2ⁿ-1) distinct two-pattern pairs for a n-input circuit under test within 2ⁿ(2ⁿ-1) clock cycles. The proposed method can be easily modified to generate complete two-pattern tests for circuits having k, (k<n) inputs, within 2^k(2^k-1) clock cycles. Thus, this method is well-suited for circuits consisting of several modules with different number of inputs