Title :
Front-end ASIC for a GEM based time projection chamber
Author :
De Geronimo, Gianluigi ; Fried, Jack ; O´Connor, Paul ; Radeka, Veljko ; Smith, Graham C. ; Thorn, Craig ; Yu, Bo
Author_Institution :
Instrum. Div., Brookhaven Nat. Lab., Upton, NY, USA
Abstract :
A Time Projection Chamber for experiments with the Laser Electron Gamma Source is being developed. It is composed of a can and a single-ended, dual-stage Gas Electron Multiplier, with associated anode plane pixellated into about eight thousand pads. The front-end electronics must provide energy, timing and address information from those pads involved in measuring each track. For center of gravity determination this information must be sampled from the above-threshold pad and from the two adjacent ones. An efficient scheme for readout of the front-end channels between each measurement cycle is also required. A 32-channel front-end Application Specific Integrated Circuit has been developed to serve this detector. Fabricated in 0.25μm CMOS technology, it dissipates 41mW. Each channel implements a low noise charge preamplifier with continuous reset of new concept, shaping amplifier with band-gap referenced baseline stabilizer, single threshold discriminator, dual-phase peak detector, timing detector, and logic for neighbor enabling. The readout process is based on token passing and flag.
Keywords :
CMOS integrated circuits; application specific integrated circuits; nuclear electronics; time projection chambers; Application Specific Integrated Circuit; CMOS technology; GEM based time projection chamber; Laser Electron Gamma Source; Time Projection Chamber; associated anode plane; center of gravity; dual-stage Gas Electron Multiplier; flag; front-end ASIC; front-end channels; low noise charge preamplifier; token passing; Anodes; Application specific integrated circuits; CMOS technology; Detectors; Electron multipliers; Energy measurement; Gas lasers; Gravity; Integrated circuit measurements; Timing;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2003 IEEE
Print_ISBN :
0-7803-8257-9
DOI :
10.1109/NSSMIC.2003.1352068