Title :
MATE, a single front-end ASIC for silicon strip, Si(Li) and CsI detectors
Author :
Baron, P. ; Atkin, E. ; Blumenfeld, Y. ; Druillole, F. ; Edelbruck, P. ; Leterrier, L. ; Lugiez, F. ; Paul, B. ; Pollacco, E. ; Richard, A. ; Rouger, M. ; Wanlin, E.
Author_Institution :
CEA/DSM/DAPNIA/SEDI, CEA Saclay, Gif-sur-Yvette, France
Abstract :
MATE (Must ASIC for Time and Energy) will process signals delivered from the hodoscope MUST2. The hodoscope consists of six large area telescopes (100 cm2), each made up of a double sided Si strip detector followed by a Si(Li) and CsI crystal. MATE has sixteen channels and can deliver three types of analogue information per channel; time of flight and energy loss of the detected particle, value of leakage DC current per channel. MATE also gives a trigger logical signal corresponding to the cross over of an adjustable threshold value. The analogue information is transmitted as differential current through twisted pair to the acquisition system based on VXI-C. The slow control is assured via the I2C industrial protocol. The first version of MATE for Si(strip) is available. An update of MATE will allow it to be used for the Si(Li) and CsI detectors. MATE is a novel R&D project for nuclear physics which includes both energy and time measurements with good resolution and high energy dynamic range.
Keywords :
application specific integrated circuits; caesium compounds; nuclear electronics; silicon radiation detectors; solid scintillation detectors; CsI; CsI detectors; MATE; Must ASIC for Time and Energy; Si; Si strip detectors; Si(Li) detectors; Si:Li; adjustable threshold value; analogue information; analogue information per channel; detected particle; differential current; energy loss; hodoscope MUST2; large area telescopes; leakage DC current per channel; single front-end ASIC; sixteen channels; time of flight; trigger logical signal; Application specific integrated circuits; Detectors; Electrical equipment industry; Energy loss; Industrial control; Leak detection; Signal processing; Silicon; Strips; Telescopes;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2003 IEEE
Print_ISBN :
0-7803-8257-9
DOI :
10.1109/NSSMIC.2003.1352069