Computerized tomography based on X-ray refraction information

Conventional computerized tomography reconstructs the object by using the projection images which are imaged based on the absorption differences of substances to X-ray. In recent years, X-ray phase-contrast CT technique has been developed rapidly. Diffraction enhanced imaging (DEI) method is one of the three phase-sensitive X-ray imaging techniques which can be used for CT. DEI method can provide higher spatial resolution and distinguish more little differences in density by using monochromatic X-ray from synchrotron light sources than conventional absorption method. It can extract sample´s refraction, absorption and scattering information by using an analyser crystal in DEI. This paper discusses the CT reconstruction criteria based on DEI and reconstructs two sample´s 2D images and their 3D images. The reconstructed result is better than that of the absorption CT, which proves that the DEI-CT can be a powerful method for use in clinical tomography and material science