Performance of a low noise front-end ASIC for Si/CdTe detectors in Compton gamma-ray telescope

Author

Tajima, Hiroyasu ; Nakamoto, Tatsuya ; Tanaka, Takaaki ; Uno, Shingo ; Mitani, Takefumi ; Do Couto e Silva, Eduardo ; Fukazawa, Yasushi ; Kamae, Tuneyoshi ; Madejski, Grzegorz ; Marlow, Daniel ; Nakazawa, Kazuhiro ; Nomachi, Masaharu ; Okada, Yu ; Takahas

Author_Institution

Linear Accel. Center, Stanford Univ., CA, USA

Volume

1

fYear

2003

fDate

19-25 Oct. 2003

Firstpage

396

Abstract

Compton telescopes based on semiconductor technologies are being developed to explore the gamma-ray universe in an energy band 0.1-20 MeV, which is not well covered by the present or near-future gamma-ray telescopes. The key feature of such Compton telescopes is the high energy resolution that is crucial for high angular resolution and high background rejection capability. The energy resolution around 1 keV is required to approach physical limit of the angular resolution due to Doppler broadening. We have developed a low noise front-end ASIC, VA32TA, to realize this goal for the readout of Double-sided Silicon Strip Detector (DSSD) and Cadmium Telluride (CdTe) pixel detector which are essential elements of the semiconductor Compton telescope. We report on the design and test results of the VA32TA. We have reached an energy resolution of 1.3 keV (FWHM) for 60 keV and 122 keV at 0°C with a DSSD and 1.7 keV (FWHM) with a CdTe detector.

Keywords

II-VI semiconductors; cadmium compounds; elemental semiconductors; gamma-ray astronomy; gamma-ray detection; silicon; silicon radiation detectors; 0.1 to 20 MeV; 1.7 keV; 122 keV; 60 keV; CdTe pixel detector; Compton gamma-ray telescope; Doppler broadening; Double-sided Silicon Strip Detector; Si/CdTe detectors; gamma-ray universe; high angular resolution; high background rejection capability; high energy resolution; low noise front-end ASIC; semiconductor technologies; Application specific integrated circuits; Decision support systems; Energy resolution; Gamma ray detection; Gamma ray detectors; Semiconductor device noise; Silicon; Space technology; Strips; Telescopes;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium Conference Record, 2003 IEEE

ISSN

1082-3654

Print_ISBN

0-7803-8257-9

Type

conf

DOI

10.1109/NSSMIC.2003.1352071

Filename

1352071