• DocumentCode
    1821080
  • Title

    Self-checking architectures for fast Hartley transform

  • Author

    Tahir, Jamel M. ; Dlay, Satnam S. ; Naguib, Raouf N G ; Hinton, Oliver R.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Newcastle upon Tyne Univ., UK
  • fYear
    1995
  • fDate
    6-9 Mar 1995
  • Firstpage
    363
  • Lastpage
    371
  • Abstract
    For many real-time and scientific applications, it is desirable to perform signal and image processing algorithms by means of special hardware in very high speed. With the advent of VLSI technology, large collections of processing elements can be used to achieve high-speed computations. In such designs, fault detection is required to ensure the validity of the results. The fast Hartley transform (FHT) serves for all the uses such as spectral analysis and digital convolution to which the FFT is currently applied. It can be applied as a more convenient way of calculating the FFT without the need to work on complex numbers. In this paper we present self-checking array architectures for the radix-2 FHT transform and for Fermat number transform (FNT)-based Hartley transform. The results show that it is possible to design algorithm-based error detection schemes for both the direct (FFT like) FHT and the FNT-based FHT with reasonable hardware and time overheads
  • Keywords
    Hartley transforms; VLSI; array signal processing; built-in self test; convolution; digital signal processing chips; error detection; parallel architectures; spectral analysis; Fermat number transform; VLSI technology; algorithm-based error detection schemes; array architectures; digital convolution; fast Hartley transform; fault detection; high-speed computations; processing elements; radix-2 FHT transform; spectral analysis; Algorithm design and analysis; Computer architecture; Convolution; Fault detection; Hardware; Image processing; Redundancy; Signal processing; Spectral analysis; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    European Design and Test Conference, 1995. ED&TC 1995, Proceedings.
  • Conference_Location
    Paris
  • Print_ISBN
    0-8186-7039-8
  • Type

    conf

  • DOI
    10.1109/EDTC.1995.470370
  • Filename
    470370