DocumentCode :
1821095
Title :
Programmable embedded IF source for wireless test
Author :
Eisenstadt, William R. ; Sanghoon Choi
Author_Institution :
University of Florida
fYear :
2002
fDate :
2002
Firstpage :
172
Lastpage :
172
Keywords :
Analog circuits; Circuit testing; Controllability; Dynamic range; Observability; Production; Radio frequency; Signal analysis; Spectral analysis; Time to market;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
Print_ISBN :
0-7695-1570-3
Type :
conf
DOI :
10.1109/VTS.2002.1011131
Filename :
1011131
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1821095
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