DocumentCode
1821095
Title
Programmable embedded IF source for wireless test
Author
Eisenstadt, William R. ; Sanghoon Choi
Author_Institution
University of Florida
fYear
2002
fDate
2002
Firstpage
172
Lastpage
172
Keywords
Analog circuits; Circuit testing; Controllability; Dynamic range; Observability; Production; Radio frequency; Signal analysis; Spectral analysis; Time to market;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
Print_ISBN
0-7695-1570-3
Type
conf
DOI
10.1109/VTS.2002.1011131
Filename
1011131
Link To Document