DocumentCode
1821108
Title
Area versus detection latency trade-offs in self-checking memory design
Author
Kebichi, Omar ; Zorian, Yervant ; Nicolaidis, Michael
Author_Institution
Reliable Integrated Syst. Group, TIMA/INPG, Grenoble, France
fYear
1995
fDate
6-9 Mar 1995
Firstpage
358
Lastpage
362
Abstract
With the increasing need for on-line reliability today´s electronic systems often require certain levels of self-checking. Depending on its application, the level of self-checking, i.e. the detection latency, of a given system is determined. Most of the known on-line testing schemes provide a fixed level of self-checking, hence do not allow flexibility in meeting the allowed detection latency and hardware overhead. This paper presents a new self-checking scheme for memories (RAMs, ROMs, etc.), which provides trade-off between hardware cost versus detection latency. The scheme takes the required detection latency and determines the codes to meet the system requirements. The paper also illustrates the flexibility of this scheme with certain implementation examples
Keywords
built-in self test; design for testability; integrated circuit testing; integrated memory circuits; random-access storage; read-only storage; BIST; RAMs; ROMs; concurrent testing; design for testability; detection latency; hardware cost; hardware overhead; self-checking memory design; system requirements; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Costs; Decoding; Delay; Hardware; Random access memory; Read only memory;
fLanguage
English
Publisher
ieee
Conference_Titel
European Design and Test Conference, 1995. ED&TC 1995, Proceedings.
Conference_Location
Paris
Print_ISBN
0-8186-7039-8
Type
conf
DOI
10.1109/EDTC.1995.470371
Filename
470371
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