DocumentCode :
1821111
Title :
Open problems in wireless test and why you should care
Author :
McLaughlin, Jim
Author_Institution :
Agilent Technologies
fYear :
2002
fDate :
2002
Firstpage :
172
Lastpage :
172
Keywords :
Frequency measurement; Instruments; Measurement standards; RF signals; Radio frequency; Semiconductor device measurement; Signal design; Testing; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
Print_ISBN :
0-7695-1570-3
Type :
conf
DOI :
10.1109/VTS.2002.1011132
Filename :
1011132
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1821111
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