• DocumentCode
    1821111
  • Title

    Open problems in wireless test and why you should care

  • Author

    McLaughlin, Jim

  • Author_Institution
    Agilent Technologies
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    172
  • Lastpage
    172
  • Keywords
    Frequency measurement; Instruments; Measurement standards; RF signals; Radio frequency; Semiconductor device measurement; Signal design; Testing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
  • Print_ISBN
    0-7695-1570-3
  • Type

    conf

  • DOI
    10.1109/VTS.2002.1011132
  • Filename
    1011132
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1821111