Title : 
Examining transactive memory system in R&D teams
         
        
            Author : 
Huang, C.C. ; Jiang, P.C.
         
        
            Author_Institution : 
Dept. of Ind. & Bus. Manage., Aletheia Univ., Tainan, Taiwan
         
        
        
        
        
        
            Abstract : 
Teamwork has become a preferred method used by organizations to conduct R&D. As the importance of teamwork in R&D increases, additional research is needed to gain insight into what constitutes successful R&D teams. The transactive memory system (TMS) postulates that team members have a shared understanding of which team member knows what. R&D is knowledge-intensive. Thus, R&D members need to develop TMS such that knowledge are effectively communicated and integrated when tasks are performed. This study examines the role of TMS in R&D teams. Our research model utilizes data drawn from a sample of 168 members of 32 R&D teams in Taiwan and is analyzed using the partial least squares (PLS) method. The results of this study indicate: (1) network ties positively affect TMS, (2) TMS positively affects team performance and (3) knowledge integration mediates the relationship between TMS and team performance. This study discusses implications for R&D team management.
         
        
            Keywords : 
least squares approximations; research and development management; team working; R-and-D team management; partial least squares method; research-and-development teams; transactive memory system; Correlation; Knowledge engineering; Organizations; Programming; Psychology; Reliability; Teamwork; TMS; knowledge integration; network ties; partial least squares; team performance;
         
        
        
        
            Conference_Titel : 
Industrial Engineering and Engineering Management (IEEM), 2010 IEEE International Conference on
         
        
            Conference_Location : 
Macao
         
        
        
            Print_ISBN : 
978-1-4244-8501-7
         
        
            Electronic_ISBN : 
2157-3611
         
        
        
            DOI : 
10.1109/IEEM.2010.5674208