A new method for testing the effective number of bits of analog to digital converters

Author

Simões, J. Basílioi ; Loureiro, Custodio F. M. ; Landeck, Jorge ; Correia, Carlos M B A

Author_Institution

Dept. de Fisica, Coimbra Univ., Portugal

Volume

1

fYear

1996

fDate

2-9 Nov 1996

Firstpage

483

Abstract

A new testing method has been used to evaluate the dynamic performance of several digitizing systems used in nuclear physics experiments. This recently introduced method allows the determination of the signal to noise ratio of the converter, not including its harmonic distortion, using an excitation signal noisier than the digitizer quantization noise. This quality makes it specially useful to evaluate the dynamic performance of high resolution analog to digital converters. The immunity of the method to non-coherent sampling and its behaviour in the presence of jitter errors are emphasised

Keywords

analogue-digital conversion; detector circuits; electron device noise; electronic equipment testing; error analysis; jitter; nuclear electronics; quantisation (signal); analog to digital converters; digitizer quantization noise; digitizing systems; dynamic performance; effective bit number; harmonic distortion; jitter errors; noncoherent sampling; nuclear physics experiments; signal to noise ratio; testing method; Analog-digital conversion; Harmonic distortion; Linearity; Noise level; Nuclear physics; Quantization; Sampling methods; Signal resolution; Signal to noise ratio; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium, 1996. Conference Record., 1996 IEEE

Conference_Location

Anaheim, CA

ISSN

1082-3654

Print_ISBN

0-7803-3534-1

Type

conf

DOI

10.1109/NSSMIC.1996.591036

Filename

591036