DocumentCode
1821171
Title
Test as a key enabler for faster yield ramp-up
Author
Segal, Julie ; Segers, Rene
Author_Institution
HPL
fYear
2002
fDate
April 28 2002-May 2 2002
Firstpage
177
Lastpage
177
Keywords
Automatic testing; Computerized monitoring; Failure analysis; Inspection; Integrated circuit testing; Life testing; Manufacturing processes; Random access memory; Semiconductor device testing; Topology;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
Conference_Location
Monterey, CA, USA
Print_ISBN
0-7695-1570-3
Type
conf
DOI
10.1109/VTS.2002.1011135
Filename
1011135
Link To Document