DocumentCode
1821235
Title
Speeding up the Byzantine fault diagnosis using symbolic simulation
Author
Huang, Shi-Yu
Author_Institution
Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
fYear
2002
fDate
2002
Firstpage
193
Lastpage
198
Abstract
Fault diagnosis is to predict the potential fault sites in a logic IC. In this paper, we particularly address the problem of diagnosing faults that exhibit the so-called Byzantine General´s phenomenon, in which a fault manifests itself as a non-logical voltage level at the fault site. Previously, explicit enumeration was suggested to deal with such a problem. However, it is often too time-consuming because the CPU time is exponentially proportional to fanout degree of the circuit under diagnosis. To speed up this process, we present an implicit enumeration technique using symbolic simulation. Experimental results show that the CPU time can be improved by several orders of magnitude for ISCAS85 benchmark circuits.
Keywords
CMOS logic circuits; binary decision diagrams; combinational circuits; fault diagnosis; fault simulation; integrated circuit testing; logic testing; symbol manipulation; Byzantine fault diagnosis; Byzantine general phenomenon; Byzantine stuck-open faults; CMOS logic circuit; CPU time improvement; ISCAS85 benchmark circuits; combinational circuits; fanout degree; implicit enumeration technique; logic IC; nonlogical voltage level; ordered binary decision diagram; symbolic simulation; Cause effect analysis; Central Processing Unit; Circuit faults; Circuit simulation; Dictionaries; Fault diagnosis; Logic gates; Manufacturing; Silicon; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
Print_ISBN
0-7695-1570-3
Type
conf
DOI
10.1109/VTS.2002.1011138
Filename
1011138
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