DocumentCode :
1821256
Title :
Filters designed for testability wrapped on the Mixed-Signal Test Bus
Author :
Calvano, Jose Vicente ; Alves, Vladimir Castro ; Lubaszewski, Marcelo ; Mesquita, Antonio C.
Author_Institution :
Brazilian Navy Res. Inst., Brazil
fYear :
2002
fDate :
2002
Firstpage :
201
Lastpage :
206
Abstract :
This work presents a design for test method for continuous time active filters of any order, using the IEEE 1149.4 as its backbone structure. The method relies on the synthesis of filter transfer functions using partial fraction extraction. Transfer functions are built from 1st order blocks connected via the available standard infrastructure. Under this approach, structural test can be carried out using simple test vectors, which are disclosed according to a fault simulation process.
Keywords :
built-in self test; continuous time filters; design for testability; fault simulation; integrated circuit testing; mixed analogue-digital integrated circuits; transfer functions; BIST; IEEE 1149.4 backbone structure; Mixed-Signal Test Bus; continuous time active filters; design for test method; fault simulation; filter transfer function synthesis; functional fault model; partial fraction extraction; structural test; test vectors; Active filters; Application software; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Design methodology; Integrated circuit modeling; Maintenance; Transfer functions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
Print_ISBN :
0-7695-1570-3
Type :
conf
DOI :
10.1109/VTS.2002.1011139
Filename :
1011139
Link To Document :
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