Filters designed for testability wrapped on the Mixed-Signal Test Bus

Author

Calvano, Jose Vicente ; Alves, Vladimir Castro ; Lubaszewski, Marcelo ; Mesquita, Antonio C.

Author_Institution

Brazilian Navy Res. Inst., Brazil

fYear

2002

fDate

2002

Firstpage

201

Lastpage

206

Abstract

This work presents a design for test method for continuous time active filters of any order, using the IEEE 1149.4 as its backbone structure. The method relies on the synthesis of filter transfer functions using partial fraction extraction. Transfer functions are built from 1^st order blocks connected via the available standard infrastructure. Under this approach, structural test can be carried out using simple test vectors, which are disclosed according to a fault simulation process.

Keywords

built-in self test; continuous time filters; design for testability; fault simulation; integrated circuit testing; mixed analogue-digital integrated circuits; transfer functions; BIST; IEEE 1149.4 backbone structure; Mixed-Signal Test Bus; continuous time active filters; design for test method; fault simulation; filter transfer function synthesis; functional fault model; partial fraction extraction; structural test; test vectors; Active filters; Application software; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Design methodology; Integrated circuit modeling; Maintenance; Transfer functions;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE

Print_ISBN

0-7695-1570-3

Type

conf

DOI

10.1109/VTS.2002.1011139

Filename

1011139