Title :
Improved sequential ATPG using functional observation information and new justification methods
Author :
Park, Jaehong ; Oh, Chanhee ; Mercer, Ray M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
Abstract :
Sequential ATPG (Automatic Test Pattern Generation) is a very desirable CAD tool, but to date, the site and complexity of circuits for which sequential ATPG could be performed has been limited. We have discovered a method for collecting functional information which makes fault observation significantly easier. We also propose a new method for state justification which is a combination of function-based methods and structure-based methods. Our sequential ATPG system deals with circuits without a reset state or a synchronizing sequence, and the experimental results show that the proposed method achieves significant improvements over existing sequential ATPG methods
Keywords :
VLSI; automatic testing; fault diagnosis; integrated circuit testing; logic testing; sequential circuits; CAD tool; automatic test pattern generation; fault observation; function-based methods; functional observation information; justification methods; sequential ATPG; state justification; structure-based methods; Automatic test pattern generation; Circuit faults; Circuit testing; Contracts; Iterative algorithms; Performance analysis; Reachability analysis; Sequential analysis; Sequential circuits; Test pattern generators;
Conference_Titel :
European Design and Test Conference, 1995. ED&TC 1995, Proceedings.
Conference_Location :
Paris
Print_ISBN :
0-8186-7039-8
DOI :
10.1109/EDTC.1995.470386
