Title :
Stacked Photo-Sensing Devices Based on SiC Alloys: A Non-pixelled Architecture for Imagers and Demultiplexing Devices
Author :
Vieira, M. ; Louro, P. ; Fernandes, M. ; Fantoni, A. ; Vieira, M.A. ; Costa, J.
Author_Institution :
Electron. Telecommun. & Comput. Dept, ISEL, Lisbon, Portugal
Abstract :
In this review paper different designs based on stacked p-i´-n-p-i-n heterojunctions are presented and compared with the single p-i-n sensing structures. The imagers utilise self- field induced depletion layers for light detection and a modulated laser beam for sequential readout. The effect of the sensing element structure, cell configurations (single or tandem), and light source properties (intensity and wavelength) are correlated with the sensor output characteristics (light-to-dark sensivity, spatial resolution, linearity and S/N ratio). The readout frequency is optimized showing that scans speeds up to 104 lines per second can be achieved without degradation in the resolution. Multilayered p-i´-n-p-i-n heterostructures can also be used as wavelength-division multiplexing /demultiplexing devices in the visible range. Here the sensor element faces the modulated light from different input colour channels, each one with a specific wavelength and bit rate. By reading out the photocurrent at appropriated applied bias, the information is multiplexed or demultiplexed and can be transmitted or recovered again. Electrical models are present to support the sensing methodologies.
Keywords :
image sensors; optimisation; photodetectors; silicon compounds; wavelength division multiplexing; SiC; cell configurations; electrical models; input colour channels; light detection; light source properties; modulated laser beam; p-i-n sensing element structures; readout frequency; self-field induced depletion layers; sequential readout; stacked p-i-n-p-i-n heterojunctions; stacked photo-sensing devices; wavelength division multiplexing device; Image color analysis; Optical filters; Optical imaging; Optical sensors; P-i-n diodes; Photoconductivity; Sensitivity; electrical simulation; optical communications; optical sensors; wavelength division multiplexing-demultiplexing;
Conference_Titel :
Sensor Technologies and Applications (SENSORCOMM), 2010 Fourth International Conference on
Conference_Location :
Venice
Print_ISBN :
978-1-4244-7538-4
DOI :
10.1109/SENSORCOMM.2010.16