DocumentCode
1821536
Title
Automated super-resolution detection of fluorescent rods in 2D
Author
Zhang, Bo ; Enninga, Jost ; Olivo-Marin, Jean-Christophe ; Zimmer, Christophe
Author_Institution
Quantitative Image Anal. Group, Institut Pasteur, Paris
fYear
2006
fDate
6-9 April 2006
Firstpage
1296
Lastpage
1299
Abstract
We describe a method designed to detect fluorescent rods from 2D microscopy images. It is motivated by the desire to study the dynamics of bacteria such as Shigella. The methodology is adapted from a super-resolution spot detection algorithm and is based on a parametric model of the rods and the microscope PSF. The algorithm consists of two parts: 1) a pre-detection step, based on thresholding a score computed from the product of the mean curvature and the local intensity of the filtered image, 2) an iterative procedure, where a mixture model of blurred segments is fitted to the image, and segments are removed, then added under the control of hypothesis tests. An upper bound is provided for the probability of erroneously detecting rods in noise. We show that the algorithm can reliably detect and accurately localize rods from low SNR images and can distinguish rods separated by subresolution distances. We also illustrate its ability to identify and separate overlapping bacteria on a real image
Keywords
biological techniques; biology computing; cellular biophysics; fluorescence; image resolution; iterative methods; microorganisms; optical microscopy; optical transfer function; 2D microscopy images; Shigella; automated super-resolution detection; bacterial dynamics; blurred segments; fluorescent rods; iterative procedure; local filtered image intensity; low SNR images; microscope PSF; noise; super-resolution spot detection algorithm; thresholding; Design methodology; Detection algorithms; Fluorescence; Image segmentation; Iterative algorithms; Microorganisms; Microscopy; Parametric statistics; Testing; Upper bound;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Imaging: Nano to Macro, 2006. 3rd IEEE International Symposium on
Conference_Location
Arlington, VA
Print_ISBN
0-7803-9576-X
Type
conf
DOI
10.1109/ISBI.2006.1625163
Filename
1625163
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