Title :
A statistical image-based approach for the 3D reconstruction of the scoliotic spine from biplanar radiographs
Author :
Kadoury, S. ; Cheriet, F. ; Labelle, H.
Author_Institution :
Dept. of Biomed. Eng., Ecole Polytech. of Montreal, Montreal, QC
Abstract :
In this paper, we propose a hybrid approach using a statistical 3D model of the spine generated from a database of 732 scoliotic patients with high-level anatomical primitives identified and matched on biplanar radiographic images for the three-dimensional reconstruction of the scoliotic spine. The 3D scoliotic curve reconstructed from a coronal and sagittal radiograph is used to generate an approximate statistical model based on a transformation algorithm which incorporates intuitive geometrical properties. An iterative optimization procedure integrating similarity measures such as deformable vertebral contours and epipolar constraints is then applied to globally refine the 3D anatomical landmarks on each vertebra level of the spine. A qualitative evaluation of the retro-projection of the vertebral contours obtained from the proposed method gave promising results while the quantitative comparison yield similar accuracy on the localization of low-level primitives such as the six landmarks identified by an expert on each vertebra.
Keywords :
bone; diagnostic radiography; diseases; image reconstruction; iterative methods; medical image processing; optimisation; statistical analysis; 3D scoliotic curve; biplanar radiographic images; deformable vertebral contours; epipolar constraints; iterative optimization procedure; scoliosis; scoliotic spine; statistical 3D model; three-dimensional scoliotic spine reconstruction; transformation algorithm; Biomedical engineering; Computed tomography; Data mining; Deformable models; Diagnostic radiography; Image reconstruction; Pathology; Shape; Solid modeling; Spine; 3D spine reconstruction; deformable contours; radiographs statistical model; scoliosis;
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2008. ISBI 2008. 5th IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-2002-5
Electronic_ISBN :
978-1-4244-2003-2
DOI :
10.1109/ISBI.2008.4541082