DocumentCode
1821977
Title
Approximating infinite dynamic behavior for DRAM cell defects
Author
AL-Ars, Zaid ; Van de Goor, Ad J.
Author_Institution
Sect. of Comput. Eng., Delft Univ. of Technol., Netherlands
fYear
2002
fDate
2002
Firstpage
401
Lastpage
406
Abstract
Analyzing the dynamic faulty behavior in DRAMs is a severely time consuming task, because of the exponential growth of the analysis time needed with each memory operation added to the sensitizing operation sequence of the fault. In this paper, a new fault analysis approach for DRAM cell defects is presented where the total infinite space of dynamic faulty behavior can be approximated within a limited amount of analysis time. The paper also presents the analysis results for some cell defects using the new approach, in combination with detection conditions that guarantee the detection of any detectable dynamic faults in the defective cell.
Keywords
DRAM chips; circuit simulation; fault diagnosis; integrated circuit testing; DRAM cell defects; defect simulation; dynamic fault; functional fault models; infinite dynamic behavior; memory testing; Analytical models; Fault detection; Information analysis; Information technology; Logic; Random access memory; Resource description framework; Taxonomy; Testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
Print_ISBN
0-7695-1570-3
Type
conf
DOI
10.1109/VTS.2002.1011171
Filename
1011171
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