• DocumentCode
    1822060
  • Title

    Alignment systems for the PHENIX muon tracking chambers

  • Author

    Brooks, M.L. ; Lee, D.M. ; Sondheim, W.

  • Author_Institution
    Los Alamos Nat. Lab., NM, USA
  • Volume
    1
  • fYear
    1996
  • fDate
    2-9 Nov 1996
  • Firstpage
    523
  • Abstract
    The alignment systems required for the PHENIX muon tracking chamber system will be described. These systems include the system that has been developed to accurately electro-etch cathode strip foils with respect to external fiducial marks to a 25 μm accuracy, as well as the system that is being developed to measure the relative alignment of three stations of chambers spanning 4.5 meters, to an accuracy of 25 μm
  • Keywords
    muon detection; particle spectrometers; particle track visualisation; position sensitive particle detectors; PHENIX muon tracking chambers; alignment systems; cathode strip foils electro-etching; external fiducial marks; relative alignment; Cathodes; Current measurement; Etching; Fasteners; Magnetic field measurement; Magnetic separation; Mass spectroscopy; Mesons; Position measurement; Strips;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium, 1996. Conference Record., 1996 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-3534-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1996.591049
  • Filename
    591049