Title :
Practical solutions for the application of the oscillation-based-test: start-up and on-chip evaluation
Author :
Vázquez, Diego ; Huertas, Gloria ; Leger, Gildas ; Rueda, Adoración ; Huertas, José L.
Author_Institution :
Instituto de Microelectron., Univ. de Sevilla, Spain
Abstract :
This paper presents practical solutions for two of the main topics arising when applying oscillation-based-test: the start-up of the configured oscillator and the on-chip evaluation of the generated test signals. The required circuitry is very simple and robust. Moreover, preliminary results obtained from an integrated prototype are also included.
Keywords :
analogue integrated circuits; biquadratic filters; built-in self test; integrated circuit testing; oscillators; switched capacitor filters; BIST; DC level measurement counter; SC filter; amplitude measurement counters; analog testing; configured oscillator start-up; embedded building block testing; integrated prototype; mixed-signal ICs; on-chip evaluation; oscillation-based test; programmable biquad; test signals; Built-in self-test; Circuit faults; Circuit testing; Distortion measurement; Frequency measurement; Oscillators; Pins; Prototypes; Robustness; Signal generators;
Conference_Titel :
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
Print_ISBN :
0-7695-1570-3
DOI :
10.1109/VTS.2002.1011176
