Title :
Functional test for shifting-type FIFOs
Author :
Van de Goor, Ad J. ; Schanstra, Ivo ; Zorian, Yervant
Author_Institution :
Delft Univ. of Technol., Netherlands
Abstract :
FIFO memories impose special test problems because of their built-in addressing restrictions and access limitations. With the increasing use of FIFOs, as a stand-alone chip or as embedded macros in ASICs, generic algorithms are needed to test FIFOs. This paper addresses the problem of testing the widely available shifting-type FIFOs; it introduces specific fault models and a set of generic tests which have a test length of O(n) and can be used for the stand-alone chip as well as for the embedded macro version of the FIFO
Keywords :
fault diagnosis; integrated circuit testing; integrated memory circuits; logic testing; ASIC embedded macro; FIFO memories; fault models; functional test; generic tests; shifting-type FIFOs; stand-alone chip; Clocks; Counting circuits; Instruments; Logic arrays; Logic testing; Manufacturing; Random access memory; Read-write memory; Shift registers; Timing;
Conference_Titel :
European Design and Test Conference, 1995. ED&TC 1995, Proceedings.
Conference_Location :
Paris
Print_ISBN :
0-8186-7039-8
DOI :
10.1109/EDTC.1995.470408
