DocumentCode :
182215
Title :
Enhanced RF performance in multi-tunnel backward-wave oscillators
Author :
Chan-Wook Baik ; Yongsung Kim ; Ho Young Ahn ; Jooho Lee ; Seogwoo Hong ; Sanghun Lee ; Junhee Choi ; Kyung-Sang Cho ; Sunil Kim ; Ives, R. Lawrence ; Jong Min Kim ; Sungwoo Hwang
Author_Institution :
Samsung Adv. Inst. of Technol., Yongin, South Korea
fYear :
2014
fDate :
22-24 April 2014
Firstpage :
67
Lastpage :
68
Abstract :
We propose an efficient beam-wave interaction circuit employing a multi-tunnel, slow-wave structure for W-band backward-wave oscillators. The tunnel is disposed one of above and below the beam tunnel, which enhances RF characteristics. The interaction circuit is prepared using a deep-reactive ion etched (DRIE), multi-level microfabrication on silicon wafers. The return loss shows strong resonances predicted by finite-element method (FEM) simulations. The multi-tunnel interaction circuit demonstrates almost similar aspect in return loss to the circuit without beam tunnel. A 1.6 times increase in RF output power is estimated from the particle-in-cell calculation, when compared to the case without multi-tunnel structure. Therefore, we conclude that the multi-tunnel, slow-wave structure successfully improves RF performance.
Keywords :
backward wave oscillators; finite element analysis; microwave oscillators; slow wave structures; sputter etching; DRIE; FEM; RF output power; W-band backward-wave oscillators; beam-wave interaction circuit; deep-reactive ion etched; finite-element method; multi-tunnel structure; multilevel microfabrication; multitunnel backward-wave oscillators; multitunnel interaction circuit; particle-in-cell calculation; return loss; silicon wafers; slow-wave structure; Finite element analysis; Integrated circuit modeling; Microfabrication; Oscillators; Power generation; Radio frequency; Silicon; DRIE; W-band; backward wave; interaction circuit; microfabrication; multi-level; multi-tunnel; oscillation; slow-wave structure;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electronics Conference, IEEE International
Conference_Location :
Monterey, CA
Type :
conf
DOI :
10.1109/IVEC.2014.6857493
Filename :
6857493
Link To Document :
بازگشت