DocumentCode :
1822161
Title :
SoCs with MEMS? Can we include MEMS in the SoCs design and test flow?
Author :
Mir, S. ; Kerkhoff, H. ; Blanton, R.D. ; Bederr, H. ; Klim, H.
Author_Institution :
TIMA Laboratory
fYear :
2002
fDate :
April 28 2002-May 2 2002
Firstpage :
449
Lastpage :
449
Keywords :
Accelerometers; Costs; Electronics packaging; Fabrication; Failure analysis; Laboratories; Micromechanical devices; System-on-a-chip; Test equipment; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7695-1570-3
Type :
conf
DOI :
10.1109/VTS.2002.1011179
Filename :
1011179
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1822161
