DocumentCode
1822199
Title
Author index
fYear
2002
fDate
2-2 May 2002
Firstpage
451
Lastpage
452
Abstract
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
Conference_Location
Monterey, CA, USA
Print_ISBN
0-7695-1570-3
Type
conf
DOI
10.1109/VTS.2002.1011180
Filename
1011180
Link To Document