DocumentCode :
1822236
Title :
Conduction mechanism and stability of organic light-emitting diodes depending on the Al-based cathodes
Author :
Chung, Dong-Hoe ; Kim, Sang Keol ; Oh, Hyun-Seok ; Hong, Jin-woong ; Lee, Won-Jae ; Lee, Joon-Ung ; Kim, Tae Wan
Author_Institution :
Dept. of Electr. Eng., Kwangwoon Univ., Seoul, South Korea
Volume :
2
fYear :
2003
fDate :
1-5 June 2003
Firstpage :
729
Abstract :
We have studied a conduction mechanism and stability of organic light-emitting diodes with a variation of cathode materials; Al, LiAl, and LiF/Al. The organic light-emitting diodes emit a light by an injection and transport of charge carriers such as holes and electrons. Thus, the charge transport is affected by the injection barrier at the interface and hopping process in the bulk. To have an efficient organic light-emitting diodes, understanding of the electrical conduction mechanism is important. By varying the cathode materials, the electron injection at the interface could be controlled because of the work function change at the cathode. We have performed the temperature-dependent electrical properties and stability of the organic light-emitting diodes in the temperature range from 10 K to 300 K. And the devices of LiAl and LiF/AI cathode, in the lifetime and luminous efficiency, are superior to those of pure-Al.
Keywords :
aluminium; aluminium alloys; brightness; carrier lifetime; cathodes; charge injection; hopping conduction; lithium alloys; lithium compounds; organic light emitting diodes; work function; 10 to 300 K; Al; Al-based cathodes; LiAl; LiF-Al; carrier lifetime; charge carrier injection; charge carrier transport; electrical conduction mechanism; electron injection interface; hopping process; injection barrier; luminous efficiency; organic light-emitting diodes; stability; temperature-dependent electrical properties; Artificial intelligence; Cathodes; Charge carrier processes; Charge carriers; Conducting materials; Electron emission; Organic light emitting diodes; Organic materials; Stability; Temperature distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 2003. Proceedings of the 7th International Conference on
ISSN :
1081-7735
Print_ISBN :
0-7803-7725-7
Type :
conf
DOI :
10.1109/ICPADM.2003.1218521
Filename :
1218521
Link To Document :
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