DocumentCode :
1822249
Title :
The Ailtech 2075 Noise Gain Analyzer
Author :
Pastori, W.E.
Volume :
4
fYear :
1983
fDate :
3-4 Nov. 1983
Firstpage :
89
Abstract :
The AILTECH 2075 NoIse Galn Analyzer represents the letest effort of the Electronic instrumentatlon Dlvlslon (EID) of EATON Corporatlon in the field of recelver/amplifler iiolse parameter measurements. AS most of you know, E!D Is the successor organlzatlon to that segment of the original Alrborne Instruments Laboratory (AIL) that has ploneered dlrect reading nofse flgure instrumentatlon slnce the late 1940´s.
Keywords :
Current measurement; Frequency measurement; Gain measurement; Instruments; Loss measurement; Noise generators; Noise measurement; Power measurement; Signal to noise ratio; Transducers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest-Fall, 22nd ARFTG
Conference_Location :
Albuquerque, NM, USA
Print_ISBN :
0-7803-5686-1
Type :
conf
DOI :
10.1109/ARFTG.1983.323566
Filename :
4118962
Link To Document :
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