DocumentCode :
1822353
Title :
Electric field dependence of luminescence due to alpha-particles in gaseous xenon and the energy expended per photon
Author :
Saito, Masaki ; Nishikawa, Tsuguo ; Miyajima, Mitsuhiro
Author_Institution :
Dept. of Eng., Fukui Univ., Japan
Volume :
1
fYear :
2003
fDate :
19-25 Oct. 2003
Firstpage :
665
Abstract :
The scintillation yield of gaseous xenon is measured as the function of electric field strength under the pressures of 1.0 and 2.0 atm. The scintillation yield rapidly decreases as the electric field increases and reaches a constant yield at higher electric field strength. The constant scintillation yield is suggested to determine the Ws-value defined as an average energy expended per photon. In this study, the Ws-value is obtained to be 59.4 ± 1.5 eV and the ratio of average scintillation yield to average ionization one is calculated to be 0.37 ± 0.01, which agrees well to Platzman´s prediction.
Keywords :
alpha-particle detection; gas scintillation detectors; ionoluminescence; xenon; 59.4 eV; Xe; alpha-particles; average scintillation yield; electric field dependence; electric field strength; energy expended per photon; gaseous xenon; luminescence; scintillation yield; Atomic measurements; Electric variables measurement; Electrons; Ionization chambers; Luminescence; Photomultipliers; Photonics; Pressure measurement; Spontaneous emission; Xenon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2003 IEEE
ISSN :
1082-3654
Print_ISBN :
0-7803-8257-9
Type :
conf
DOI :
10.1109/NSSMIC.2003.1352129
Filename :
1352129
Link To Document :
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