DocumentCode :
1822404
Title :
Circuit clustering for delay minimization under area and pin constraints
Author :
Yang, Honghua ; Wong, D.F.
Author_Institution :
Dept. of Comput. Sci., Texas Univ., Austin, TX, USA
fYear :
1995
fDate :
6-9 Mar 1995
Firstpage :
65
Lastpage :
70
Abstract :
We consider the problem of circuit partitioning for multiple-chip implementation. One motivation for studying this problem is the current needs of good partitioning tools for implementing a circuit on multiple FPGA chips. We allow duplication of logic gates as if would reduce circuit delay. Circuit partitioning with duplication of logic gates is also called circuit clustering. In this paper, we present a circuit clustering algorithm that minimizes circuit delay subject to both area and pin constraints on each chip, using the general delay model. We develop a repeated network cut technique for finding a cluster that is bounded by both area and pin constraints. Our algorithm achieves optimal delay under either the area constraint only or the pin constraint only. Under both area and pin constraints, our algorithm achieves optimal delay in most cases. We outline the condition under which the non-optimality occurs and show that the condition occurs rarely in practice. We tested our algorithm on a set of benchmark circuits and consistently obtained optimal or near-optimal delays
Keywords :
VLSI; circuit layout CAD; delays; field programmable gate arrays; logic CAD; logic partitioning; network topology; FPGA chips; VLSI layout design; area constraints; benchmark circuits; circuit clustering; circuit delay; circuit partitioning; delay minimization constraints; logic gates; multiple-chip implementation; nonoptimality; pin constraints; repeated network cut technique; Algorithm design and analysis; Benchmark testing; Circuit testing; Clustering algorithms; Delay effects; Field programmable gate arrays; Logic circuits; Logic gates; Minimization; Partitioning algorithms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
European Design and Test Conference, 1995. ED&TC 1995, Proceedings.
Conference_Location :
Paris
Print_ISBN :
0-8186-7039-8
Type :
conf
DOI :
10.1109/EDTC.1995.470418
Filename :
470418
Link To Document :
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