• DocumentCode
    1822667
  • Title

    ASTM D 5470 TIM material testing

  • Author

    Hanson, Kevin

  • Author_Institution
    Bergquist Co.
  • fYear
    2006
  • fDate
    14-16 March 2006
  • Firstpage
    50
  • Lastpage
    53
  • Abstract
    The ASTM D 54701 standard is currently being revised to cover a test method for the measurement of thermal impedance and calculation of an apparent thermal conductivity for thermal interface materials (TIM) ranging from liquid compounds to hard solids. Modifications to the procedure include the use of mechanical stops to control the specimen thickness under test and an in situ thickness measurement to monitor the specimen thickness if the thickness dimension of the specimen can change during the test. Rigid materials that will not coalesce together require the preparation of specimens of different thickness to obtain the multiple thermal impedance measurements needed to calculate the thermal conductivity. The revised method does not call out a specific clamping pressure to be used for all material types but instead specifies that the clamping pressure required is either that which is sufficient to contact the mechanical stops or to coalesce multiple layers together without damaging the test specimens. Measuring the 3 primary properties - the heat flow through the test specimen, the temperature difference across it, and the thickness of the specimen under test - is still stressed
  • Keywords
    heat transfer; materials testing; temperature measurement; thermal analysis; thermal conductivity; thermal conductivity measurement; thermal insulating materials; thickness measurement; ASTM D 54701 standard; hard solids; heat flow; liquid compounds; material testing; rigid materials; thermal conductivity; thermal impedance measurement; thermal interface materials; thickness dimension; Clamps; Conducting materials; Conductivity measurement; Current measurement; Impedance measurement; Materials testing; Measurement standards; Solids; Thermal conductivity; Thickness measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 2006 IEEE Twenty-Second Annual IEEE
  • Conference_Location
    Dallas, TX
  • Print_ISBN
    1-4244-0153-4
  • Type

    conf

  • DOI
    10.1109/STHERM.2006.1625205
  • Filename
    1625205