Title :
Electrical properties of polythylene Langmuir-Blodgett films: preparation and electrical breakdown
Author :
Manaka, T. ; Ohta, H. ; Iwamoto, M. ; Fukuzawa, M.
Author_Institution :
Dept. of Phys. Electron., Tokyo Inst. of Technol., Japan
Abstract :
Polyethylene films have been successfully prepared by the Langmuir-Blodgett technique. One deposition layer thickness was determined to be 3 nm using contact mode in the AFM method, but films were very fiat from the AFM observation. Capacitance of metal-polyethylene-metal junctions was inversely proportional to the number of deposition layers, indicating that the deposition went quite well. Using surface potential measurement, it was concluded that PE films were positively charged due to displacement of electrons from PE to metals, without applying external electric field. Electrical breakdown voltage was also examined. We could obtain very important information on the electrostatic phenomena of PE ultrathin films observed at the film-metal interface.
Keywords :
Langmuir-Blodgett films; MIM structures; atomic force microscopy; capacitance; dip coating; electric breakdown; liquid phase deposition; polymer films; surface potential; 3 nm; AFM; Al; PE films; capacitance; electrical breakdown voltage; electrical properties; electron displacement; electrostatic phenomena; film-metal interface; metal-polyethylene-metal junctions; polythylene Langmuir-Blodgett films; surface potential; Capacitance; Contacts; Current measurement; Displacement measurement; Electric breakdown; Electric variables measurement; Electrostatic measurements; Plastic films; Polyethylene; Potential well;
Conference_Titel :
Properties and Applications of Dielectric Materials, 2003. Proceedings of the 7th International Conference on
Print_ISBN :
0-7803-7725-7
DOI :
10.1109/ICPADM.2003.1218538