DocumentCode :
1822776
Title :
ARFTG Traveling Experiment Kit Round Robin Program
Author :
Dea, Patsy M.
Author_Institution :
TRW Inc., Redondo Beach, CA
Volume :
5
fYear :
1984
fDate :
30834
Firstpage :
161
Lastpage :
161
Abstract :
Vector Automatic Network Analyzer (VANA) system measurement uncertainty can be established only by controlled measurements using " standards" that have a known value within established limits. This presentation deals with the concept, standards, history, current status, and future plans for the ARFTG Traveling Experiment Kit Round Robin Program. Results of measurements, including the three major generations (8542, 8409, and 8510) of VANA\´s will be illustrated.
Keywords :
Automatic control; Control systems; Current measurement; Data envelopment analysis; History; Measurement standards; Measurement uncertainty; Round robin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest-Spring, 23rd ARFTG
Conference_Location :
Santa Rosa, CA, USA
Print_ISBN :
0-7803-5686-1
Type :
conf
DOI :
10.1109/ARFTG.1984.323585
Filename :
4118983
Link To Document :
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