High speed on line measurement of digital wire outer diameter with laser and CCD technology

Author

Hong, Zhao ; Xuan, Wang ; Rui, Wang

Author_Institution

Sch. of Electr. & Electron., Harbin Univ. of Sci. & Technol., China

Volume

2

fYear

2003

fDate

1-5 June 2003

Firstpage

812

Abstract

In this paper, development of a novel optical diameter gauge is described. In order to eliminate the influence of wire vibration in the high moving speed, The semiconductor laser diode with 1.2 μs exposure time aperture were used to be the illuminating light sources, CCD-line sensors with 5000 elements and 7 μm×7 μm element area were applied to gauge the diameter of the object. Data acquisition unit was consists of high speed A/D converter, single chip processor, DMA and SRAM to process the signal data digitally in order to gain the high accuracy. The instrument obtained 0.7 μm on line dynamic accuracy finally.

Keywords

SRAM chips; analogue-digital conversion; charge-coupled devices; data acquisition; gauges; high-speed optical techniques; microprocessor chips; optical sensors; semiconductor lasers; 1.2 mus; A/D converter; CCD line sensors; DMA; SRAM; data acquisition; digital wire; high speed on line measurement; optical diameter gauge; semiconductor laser diode; single chip processor; Apertures; Charge coupled devices; Data acquisition; Diode lasers; High speed optical techniques; Light sources; Optical sensors; Semiconductor lasers; Velocity measurement; Wire;

fLanguage

English

Publisher

ieee

Conference_Titel

Properties and Applications of Dielectric Materials, 2003. Proceedings of the 7th International Conference on

ISSN

1081-7735

Print_ISBN

0-7803-7725-7

Type

conf

DOI

10.1109/ICPADM.2003.1218543

Filename

1218543