Title :
High speed on line measurement of digital wire outer diameter with laser and CCD technology
Author :
Hong, Zhao ; Xuan, Wang ; Rui, Wang
Author_Institution :
Sch. of Electr. & Electron., Harbin Univ. of Sci. & Technol., China
Abstract :
In this paper, development of a novel optical diameter gauge is described. In order to eliminate the influence of wire vibration in the high moving speed, The semiconductor laser diode with 1.2 μs exposure time aperture were used to be the illuminating light sources, CCD-line sensors with 5000 elements and 7 μm×7 μm element area were applied to gauge the diameter of the object. Data acquisition unit was consists of high speed A/D converter, single chip processor, DMA and SRAM to process the signal data digitally in order to gain the high accuracy. The instrument obtained 0.7 μm on line dynamic accuracy finally.
Keywords :
SRAM chips; analogue-digital conversion; charge-coupled devices; data acquisition; gauges; high-speed optical techniques; microprocessor chips; optical sensors; semiconductor lasers; 1.2 mus; A/D converter; CCD line sensors; DMA; SRAM; data acquisition; digital wire; high speed on line measurement; optical diameter gauge; semiconductor laser diode; single chip processor; Apertures; Charge coupled devices; Data acquisition; Diode lasers; High speed optical techniques; Light sources; Optical sensors; Semiconductor lasers; Velocity measurement; Wire;
Conference_Titel :
Properties and Applications of Dielectric Materials, 2003. Proceedings of the 7th International Conference on
Print_ISBN :
0-7803-7725-7
DOI :
10.1109/ICPADM.2003.1218543
