• DocumentCode
    182305
  • Title

    Increased resistance of rough copper surfaces at terahertz frequencies

  • Author

    Kirley, M.P. ; Booske, John H.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Wisconsin-Madison, Madison, WI, USA
  • fYear
    2014
  • fDate
    22-24 April 2014
  • Firstpage
    157
  • Lastpage
    158
  • Abstract
    We find that the surface resistance of smooth copper exceeds that predicted by classical electromagnetic theory. We have fabricated copper surfaces with controlled roughness and grain size. We will present measurements of the reflectivity of these copper surfaces and compare these results to theoretical predictions for the THz resistance of surfaces.
  • Keywords
    electromagnetic wave scattering; grain size; rough surfaces; surface resistance; terahertz waves; controlled grain size; controlled roughness; electromagnetic theory; rough copper surfaces; surface THz resistance; terahertz frequencies; Conductivity; Copper; Rough surfaces; Surface impedance; Surface resistance; Surface roughness; Surface waves; Terahertz; conductivity; skin depth; surface resistance; vacuum;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference, IEEE International
  • Conference_Location
    Monterey, CA
  • Type

    conf

  • DOI
    10.1109/IVEC.2014.6857537
  • Filename
    6857537
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=182305