Title :
Automated Microwave VCO Subassembly Test System
Author :
Carlson, A.W. ; Hoft, R.P.
Author_Institution :
M/A-COM Corporate Technology Center, ATE Group
Keywords :
Automatic testing; Costs; Missiles; Paper technology; Radio frequency; Switches; System testing; Tuning; Voltage; Voltage-controlled oscillators;
Conference_Titel :
ARFTG Conference Digest-Fall, 24th ARFTG
Conference_Location :
Columbia, MD, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1984.323596
