DocumentCode
182338
Title
Susceptibility of dielectric-loaded, vacuum-breakdown discharges in DC
Author
Aldan, Manuel Thomas P. ; Verboncoeur, John P.
Author_Institution
Dept. of Nucl. Eng., Univ. of California at Berkeley, Berkeley, CA, USA
fYear
2014
fDate
22-24 April 2014
Firstpage
189
Lastpage
190
Abstract
This work presents a novel, simplified theory of breakdown susceptibility in dielectric-loaded systems operating in DC, with multipactor targeted as the effect of lowest-order. Limits for susceptibility are drawn with the well-known characteristics of secondary-emission [1], and 2-D particle-in-cell modeling is used to monitor the evolution of discharges via time-traces of surface-field characteristics plotted against E⊥/E|| susceptibility planes. Susceptibility in DC is shown to predict and model the general behavior of DC discharges, which may then be used to devise methods for restoring or forcing operating modes to desirable, non-multiplicative regimes.
Keywords
optical susceptibility; space charge; vacuum breakdown; 2D particle-in-cell modeling; DC discharges; breakdown susceptibility; dielectric-loaded susceptibility; lowest-order effect; secondary-emission; surface-field characteristics; vacuum-breakdown discharges; Dielectrics; Discharges (electric); Radio frequency; Steady-state; Surface discharges; Vacuum breakdown; breakdown; dc; multipactor; simulation; space-charge; susceptibility;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electronics Conference, IEEE International
Conference_Location
Monterey, CA
Type
conf
DOI
10.1109/IVEC.2014.6857554
Filename
6857554
Link To Document