• DocumentCode
    182338
  • Title

    Susceptibility of dielectric-loaded, vacuum-breakdown discharges in DC

  • Author

    Aldan, Manuel Thomas P. ; Verboncoeur, John P.

  • Author_Institution
    Dept. of Nucl. Eng., Univ. of California at Berkeley, Berkeley, CA, USA
  • fYear
    2014
  • fDate
    22-24 April 2014
  • Firstpage
    189
  • Lastpage
    190
  • Abstract
    This work presents a novel, simplified theory of breakdown susceptibility in dielectric-loaded systems operating in DC, with multipactor targeted as the effect of lowest-order. Limits for susceptibility are drawn with the well-known characteristics of secondary-emission [1], and 2-D particle-in-cell modeling is used to monitor the evolution of discharges via time-traces of surface-field characteristics plotted against E⊥/E|| susceptibility planes. Susceptibility in DC is shown to predict and model the general behavior of DC discharges, which may then be used to devise methods for restoring or forcing operating modes to desirable, non-multiplicative regimes.
  • Keywords
    optical susceptibility; space charge; vacuum breakdown; 2D particle-in-cell modeling; DC discharges; breakdown susceptibility; dielectric-loaded susceptibility; lowest-order effect; secondary-emission; surface-field characteristics; vacuum-breakdown discharges; Dielectrics; Discharges (electric); Radio frequency; Steady-state; Surface discharges; Vacuum breakdown; breakdown; dc; multipactor; simulation; space-charge; susceptibility;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference, IEEE International
  • Conference_Location
    Monterey, CA
  • Type

    conf

  • DOI
    10.1109/IVEC.2014.6857554
  • Filename
    6857554