DocumentCode
1823506
Title
When good trigger circuits go bad: A case history
Author
Gerdemann, Alex ; Miller, James W. ; Stockinger, Michael ; Herr, Norman ; Dobbin, Allan ; Ricklefs, Reyhan
Author_Institution
Freescale Semicond. Inc., Austin, TX, USA
fYear
2011
fDate
11-16 Sept. 2011
Firstpage
1
Lastpage
6
Abstract
A case history is presented of an advanced latched dual time constant ESD transient trigger circuit design. An unexpected failure occurred with this design which interfered with functional operation of the device. Analysis of the failure is presented along with successful circuit fixes and techniques that ensure safe operation of these circuits.
Keywords
electrostatic discharge; failure analysis; flip-flops; logic design; trigger circuits; case history; failure analysis; latched dual time constant ESD transient; trigger circuit design; Clamps; Electrostatic discharge; Logic gates; MOS devices; Mirrors; Resistors; Trigger circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd
Conference_Location
Anaheim, CA
ISSN
Pending
Electronic_ISBN
Pending
Type
conf
Filename
6045572
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