DocumentCode :
1823626
Title :
CDM secondary clamp of RX and TX for high speed SerDes application in 40nm CMOS technology
Author :
Okushima, Mototsugu ; Tsuruta, Junji
Author_Institution :
Renesas Electron. Corp., Kawasaki, Japan
fYear :
2011
fDate :
11-16 Sept. 2011
Firstpage :
1
Lastpage :
6
Abstract :
Novel secondary clamp solutions to boost CDM robustness for both RX and TX circuits along with dual diode of 135fF to meet over 6-G bit/s SerDes are presented. For RX circuit, active PMOS clamp with no voltage overshoot is used as secondary clamp to GND. For TX circuit, by constructing a secondary ESD path through the pre-driver and pumping-up the gate node of the main-driver, an additional series resistor deteriorating SerDes performance is not needed for secondary clamp.
Keywords :
CMOS integrated circuits; resistors; CDM robustness; CDM secondary clamp; CMOS technology; GND; PMOS clamp; RX circuit; TX circuit; bit rate 6 Gbit/s; dual diode; high speed SerDes application; secondary ESD path; series resistor; size 40 nm; Capacitance; Clamps; Electrostatic discharge; Logic gates; Resistors; Stress; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd
Conference_Location :
Anaheim, CA
ISSN :
Pending
Electronic_ISBN :
Pending
Type :
conf
Filename :
6045576
Link To Document :
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