DocumentCode :
1823650
Title :
Effect of mobility on (IV) characteristics of GaAs MESFET
Author :
Saidi, Y. ; Alliouat, W. ; Hamma, I. ; Zaabat, Mourad ; Azizi, Masood ; Azizi, Cherifa
Author_Institution :
Dept. of Phys., Mentouri Univ. Constantine, Constantine, Algeria
fYear :
2011
fDate :
8-10 Sept. 2011
Firstpage :
227
Lastpage :
231
Abstract :
We present in this paper an analytical model of the current-voltage (I-V) characteristics for submicron GaAs MESFET transistors. This model takes account the analysis of the charge distribution in the active region and incorporate a field depended electron mobility, velocity saturation and charge build-up in the channel. We propose In this framework an algorithm of simulation based on mathematical expressions obtained previously. The results obtained of the model are discussed and compared with those of the experimental data reading obtained from the literature [1], The agreement has been shown to be good.
Keywords :
III-V semiconductors; Schottky gate field effect transistors; carrier mobility; gallium arsenide; mathematical analysis; semiconductor device models; GaAs; MESFET transistors; charge build-up; charge distribution; current-voltage characteristics; electron mobility; mathematical expressions; mobility effect; velocity saturation; GaAs; MESFET; Modelling; mobility;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Machines and Power Electronics and 2011 Electromotion Joint Conference (ACEMP), 2011 International Aegean Conference on
Conference_Location :
Istanbul
Print_ISBN :
978-1-4673-5004-4
Electronic_ISBN :
978-1-4673-5002-0
Type :
conf
DOI :
10.1109/ACEMP.2011.6490600
Filename :
6490600
Link To Document :
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