Title :
Metalloproteins thin films
Author :
Margalit, Ruth ; Vasquez, Richard P.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Padadena, CA, USA
Abstract :
The structure and orientation of metalloproteins adsorbed onto semiconductor and metal surfaces were investigated. X-ray photoelectron spectroscopy (XPS) techniques were used in conjunction with novel myoglobin derivatives. In these myoglobin derivatives, a pentammine ruthenium (III) group is attached to specific histidine residues on the protein surface. The Fe-Ru distance in these derivatives was calculated and found to be on the order of 13-25 Å. Measurements of the intensity ratio of the Ru 3p3/2 or Ru 3d5/2 to Fe 2p3/2 XPS peaks provide an indicator of the degree of ordering in the film
Keywords :
X-ray photoelectron spectra; molecular biophysics; proteins; Fe-Ru distance; X-ray photoelectron spectroscopy; degree of ordering; histidine residues; intensity ratio; metal surfaces; metalloproteins thin films; myoglobin derivatives; orientation; pentammine ruthenium group; protein surface; semiconductor surfaces; structure; Amino acids; Biological control systems; Biological materials; Iron; Laboratories; Molecular electronics; Proteins; Semiconductor thin films; Substrates; Transistors;
Conference_Titel :
Engineering in Medicine and Biology Society, 1989. Images of the Twenty-First Century., Proceedings of the Annual International Conference of the IEEE Engineering in
Conference_Location :
Seattle, WA
DOI :
10.1109/IEMBS.1989.96213
